Subscribe! eNewsletter Magazines About Us  |  Advertise  |  Contact Us  |  Site Map

Current Publications

Global Publications
advertisement
advertisement
Top

Solid State Technology

Volume: 51
Issue: 1
Date: January 01, 2008
Laterally resolved phase measurements at 45nm using photomask phase metrology
As the lithography process moves toward the 45nm and 32nm nodes, phase control on the mask is becoming more important than ever.
Surface engineering for microfabrication
Richard Feynman predicted the emergence of the nanotechnology field during a now-famous Caltech lecture in 1959 [1].
Eliminating micro-cracks, crystal dislocations with single-wafer surface conditioning
Stacked-die-attach package applications require backside metal deposition for device contact within the package.
Reducing USJ-related device variability at 32nm
Single-wafer high current implanter designs with diffusion-less annealing flash or laser equipment result in both global and local micro-uniformity variations.
3D control of photomask etching using advanced CD AFM metrology
A new generation of atomic force microscopes (AFM) has been designed for critical dimension (CD) metrology applications.
Nano-engineering enables practical portable fuel cells
A variety of approaches to nano- and micro-engineering have begun to yield portable fuel cells-with dramatic cost and size advantages-for niche markets.
Embedded DRAM makes inroads into SoC devices
This month, presents a special preview of the January edition of Chip Forensics, an online column by Dick James, senior technology adviser at Chipworks, a specialty reverse engineering company that ta ...
World News
Technology News
The problems and possibilities of thin film CIGS solar cells
Among the most promising of thin-film solar cells are those made of copper indium gallium diselenide (CIGS), but controlling film composition is a big hurdle to commercialization.
Fitting many roads on one map
While laudable for establishing consensus on the current state-of-the-art in semiconductor manufacturing, the International Technology Roadmap for Semiconductors (ITRS) has not been shown to be overly ...
IEDM shows real details of materials technology, devices
Over 1600 technologists gathered in Washington, DC, last month to explore a wide range of innovative ideas at the 2007 International Electron Devices Meeting (IEDM).
Eco-friendly manufacturing the green path to profitability
The semiconductor industry value chain, including materials, equipment, manufacturing, and consumer products, has a long history of creativity and innovation in the “greening” of its opera ...
PRODUCT NEWS
Product Focus: Equipment Subsystems

Past Issues

2008

Volume Issue Date
51 12 Dec 01, 2008
51 11 Nov 01, 2008
51 10 Oct 01, 2008
51 9 Sep 01, 2008
51 8 Aug 01, 2008
51 7 Jul 01, 2008
51 6 Jun 01, 2008
51 5 May 01, 2008
51 4 Apr 01, 2008
51 3 Mar 01, 2008
51 2 Feb 01, 2008
51 1 Jan 01, 2008

Previous Years

2009 2007 2006 2005 2004 2003 2002 2001 2000 1999 1998 1997 1996
View Complete Archives Section
 

advertisements