Recent Features
- 2009 Economic forecast Look for rebound by 2010 01/01/2009
- Status and trends in 300mm manufacturing 01/01/2009
- The year ahead: a time for innovation 01/01/2009
- Featured Products 01/01/2009
- Product News 01/01/2009
Recent Products
- Centura Enabler E5 01/01/2009
- Enviro Xceed400 01/01/2009
- NT series of aligners and measurement systems 01/01/2009
- V6000 01/01/2009
- 655D CVD 01/01/2009
Related White Papers
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New Encapsulated Piezo Actuators for High-Reliability Applications in the Semiconductor Industry
12/01/2008
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Piezo Flexure Nanopositioning Stages and Scanners For Surface Metrology & Nanolithography
12/01/2008
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Sub-Nanometer Precision Hybrid Positioning Systems for Vertical Inspection Tools in Nanotechnology and Semiconductors
12/01/2008
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Newly Developed High Performance Epoxy Adhesives Revolutionize Structural Bonding
11/01/2005
Product Focus Wafer Processing
Date: May, 2008
Expanded line of sputtering targets
These sputtering targets are available in 62 different metals and alloys, as well as compounds such as borides, carbides, fluorides, nitrides, oxides, selenides, silicides, sulphides, and tellurides. In addition, the surfaces of flat sheets up to 80 × 400mm can be heat treated, remelted, or alloyed using a continuous thermal process. Thin layers of metals or oxides can also be melted onto the surface. This process is especially suited for the creation of double-layer sheets and foils, or for ceramic superconductors on metallic or ceramic substrates, and for the creation of thin layers of solder on metals. Goodfellow Corp., Oakdale, PA USA; www.goodfellow.com.
Hydrogen peroxide sensor
The new dFFOZ-P dissolved full flow hydrogen peroxide sensor is designed to monitor and control the concentrations of the critical peroxide in an SPM bath, also known as a Piranha bath, in semiconductor manufacturing cleaning processes. Compact and fully automatic, the dFFOZ-P continuously and instantaneously monitors the concentration of peroxide, enabling the automatic spiking of the SPM solution. The dFFOZ-P provides measurement of a wide range of concentrations from very dilute concentrations (700:1) up to very high concentrations (4:1) from 0 to 70,000mg/L. The sensor is “clean-ready” for high-purity semiconductor processes and can be installed inline at flow rates up to 150slpm and at temperatures in excess of 140°C. The dFFOZ-P incorporates analog and digital output proportional to concentrations, providing feedback ideal to keep the concentrations of the SPM solutions within the allowable ranges and therefore eliminate unnecessary chemical replacement, thus minimizing operating costs. IN USA Inc., Norwood, MA USA; www.inusacorp.com.


