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Solid State Technology - semiconductors, chips, integrated circuits

Features

Improve productivity at nm nodes with faster physical verification
Feb 01 -- The increasing number and complexity of design rules result in a significant increase in design rule check (DRC) run times, many more DRC violations, and an increase in the intricacy of these violations that makes them more difficult to analyze and fix....
 
Addressable array technology for systematic yield monitoring at 65nm
Sep 01 -- Random yield loss is caused predominantly by process- and equipment-generated particulates, which are monitored in the fab using inline defect-inspection tools....
 
Circuit analysis with process variation: a DFM performance metric
Apr 01 -- The primary problem with committing to today’s nanometer DFM solutions is the lack of understanding of the net benefit provided by this new generation of EDA tools....
 
 

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